Internetpräsenz von Dr. Jens Illemann

contact:

@jens-illemann.de

© Jens Illemann,
    Juni 2010

P: poster V: talk v: talk(coauthor) E: invited

P: Illemann, J, “Single-pulse-resolved dosimetry with miniaturized detectors in teletherapy”, World Congress 2009 on Medical Physics and Biomedical Engineering, 11th International Congress of the IUPESM, München, 07-12, September, 2009

V: Löffler, F.; Meeß, R.; Hagedorn, D.; Buß, A.; Illemann, J.; Kumme, R.;               “Advanced fabrication process and measurements of thin-film sensors,”; ICMC/TF 2008, San Diego, Calif., 28, April - 02, May, 2008

V: J.Illemann, „The achievable uncertainty for balance-based force standard machines in the range from micronewton to newton,“ IMEKO 20th TC3 & TC16 & TC22: 27th November - 1st December, 2007, Merida, Mexico (2007)

EV: J. Illemann, R. Kumme, "From static to dynamic force measurement," 6th International Conference on Advances in Metrology, ADMET-2006, December 11-13, 2006, New Delhi

EV: J. Illemann, R. Kumme, " The traceability of the quantity force from National Standard Machines to industrial applications," Indo-Italian Training Program on Force & Torque Metrology, December 5 – 8, 2006, NPL of India, New Delhi

P J. Illemann, R. Kumme, "Research for a national force standard machine in the range from micro Newton to Newton relying on force compensation,“ IMEKO 2006 XVIII World Congress, September 17-22, 2006, Rio de Janeiro

EV: J. Illemann, U. Brand, L. Doering, V. Nesterov, “Future Force Standard Machines
from Newton to Piconewton at PTB,“ Round Table of TC3 at IMEKO 2006 XVIII World Congress, September 17-22, 2006, Rio de Janeiro

Ev: M. Schulz, C. Elster, R.D. Geckeler, J. Illemann, I. Weingärtner, “Multiple Sensor Systems for High Accuracy Form Measurement of Flats and Aspheres,” High Level Expert Meeting of the Competence Center Ultraprecision Surface Figuring, Braunschweig 2004

V: J. Illemann, A. Just, "Absolute deflectometric measurement of topography – influence of systematic deviations," SPIE Europe International Symposium, Photonics Europe, Strasbourg 2004

EVP: J. Illemann, “An example of deflectometric measurement of topography – influence of systematic deviations”, Second Workshop on Metrology for X-ray Optics, Grenoble 1-2 April 2004

v: K.D. Bunte, M. Kobusch, J. Hollandt, J. Illemann, F. Jäger, M. Gläser, S. Sarge
“AIDA – AN ADVANCED IMPACT DETECTOR ASSEMBLY,”
54th International Astronautical Congress, Bremen 2003, Germany (co-author)

P: J. Illemann, M. Wurm
"Deflectometric Measurements of Synchrotron-Optics for Postprocessing,"
8th International Conference on Synchrotron Radiation Instrumentation, San Francisco 2003

V: J. Illemann, "Absolute high-accuracy deflectometric measurement of topography,"
SPIE’s 48th Annual Meeting, Optical Science and Technology, San Diego 2003

V: J. Illemann, M. Schulz, “Fast and robust profiler for measuring topography up to 1 meter length and 1 nanometer uncertainty,” 11th international conference for sensor technology, Nürnberg 2003

v: S. Schlemmer, J. Illemann, S. Wellert, and D. Gerlich, “Sekundärelektronenemission eines Submikrometer SiO2-Teilchens,” Frühjahrstagung der DPG, Heidelberg 1999

v: S. Schlemmer, J. Illemann, S. Wellert, and D. Gerlich, “Laboratory Experiments for the Investigation of Interstellar Dust Analogues,” 3rd Cologne-Zermatt Symposium, 1998

v: S. Schlemmer, J. Illemann, S. Wellert, and D. Gerlich, “Non-destructive, Absolute Mass Determination of Single Sub-Micrometer Sized Particles in a Paul-type Trap,” International Conference on Trapped Charged Particles and Fundamental Physics, Asilomar 1998

v: S. Schlemmer, J. Illemann, S. Wellert, and D. Gerlich, “Zerstörungsfreie Massebestimmung von Sub-Mikrometerteilchen in einem Ionenspeicher,” Frühjahrstagung der DPG, Konstanz 1998

V: J. Illemann, S. Schlemmer,  and D. Gerlich, “Non-Destructive Mass Determination of Single Sub-Micrometer Sized Particles,” Week of Doctoral Students, Prag 1998

V: J. Illemann, S. Schlemmer,  and D. Gerlich, “Preparation and Weighing of Nanoparticles,” Symposium on Nanostructured Materials and Systems, Schöneck, Germany 1997

P: J. Illemann, S. Schlemmer,  and D. Gerlich, “Preparation and Weighing of Nanoparticles,” IV European meeting of the European Network “Structure and Reactivity of Molecular Ions,” Castle Liblice, Czech Republic 1997

V: J. Illemann, R.-H. Rinkleff, K. Danzmann, “Kohärenzspektroskopie in Yb nach gepulster zweistufiger Anregung”, Frühjahrstagung der DPG, Jena 1996